The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Jun. 12, 2015
Applicant:

Egalax_empia Technology Inc., Taipei, TW;

Inventors:

Chin-Fu Chang, Taipei, TW;

Cheng-Han Lee, Taipei, TW;

Chi-Hao Tang, Taipei, TW;

Shun-Lung Ho, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G01R 27/26 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G01R 27/2605 (2013.01); G06F 3/0416 (2013.01); G06F 2203/04103 (2013.01); G06F 2203/04104 (2013.01); G06F 2203/04111 (2013.01);
Abstract

The method and processor for analyzing two-dimension information are disclosed. A 2-D information generated from a touch panel/screen is obtained, wherein the 2-D information comprises a plurality of values distributed over a plurality of reduced 2-D coordinates. Then, an approaching/touching range on the touch panel/screen approached or touched by an approaching/touching object is detected, wherein a minimum of the plurality of values distributed over a boundary of the approaching/touching range is greater than a maximum of the plurality of values inside the approaching/touching range except the boundary.


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