The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Jun. 17, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Naoko Senda, Tokyo, JP;

Yoko Inoue, Tokyo, JP;

Hiroaki Nakagawa, Tokyo, JP;

Akihiro Shimase, Tokyo, JP;

Ryota Nakajima, Tokyo, JP;

Kazumichi Imai, Tokyo, JP;

Shizu Takeda, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12M 1/34 (2006.01); C12M 1/36 (2006.01); G01N 33/68 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
C12M 41/46 (2013.01); C12M 41/48 (2013.01); G01N 33/5005 (2013.01); G01N 33/6806 (2013.01); G01N 33/6812 (2013.01);
Abstract

There is provided a method for noninvasively evaluating the cell state (proliferation, multi-layering, and differentiation) of a cell sheet as a mimic tissue at the time of culturing the cell sheet. The method is characterized in that an analysis of an amino acid is conducted with the use of the culture supernatant of a cell sheet to monitor a change in the concentration of any amino acid selected from a group of 5-species of amino acids (Ile, Val, Ser, Leu, and Ala), thereby making a determination.


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