The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2018

Filed:

Mar. 27, 2013
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Toshiyuki Nagase, Kitamoto, JP;

Takeshi Kitahara, Sunto-gun, JP;

Ryo Muranaka, Kitamoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 1/00 (2006.01); B23K 1/19 (2006.01); B32B 15/04 (2006.01); H01L 23/373 (2006.01); C04B 37/02 (2006.01); B32B 18/00 (2006.01); H01L 23/473 (2006.01); H05K 3/38 (2006.01); H05K 1/03 (2006.01);
U.S. Cl.
CPC ...
B23K 1/0016 (2013.01); B23K 1/19 (2013.01); B32B 15/04 (2013.01); B32B 18/00 (2013.01); C04B 37/026 (2013.01); H01L 23/3735 (2013.01); H05K 3/383 (2013.01); B32B 2457/00 (2013.01); C04B 2235/6581 (2013.01); C04B 2235/723 (2013.01); C04B 2235/963 (2013.01); C04B 2237/121 (2013.01); C04B 2237/126 (2013.01); C04B 2237/128 (2013.01); C04B 2237/366 (2013.01); C04B 2237/402 (2013.01); C04B 2237/52 (2013.01); C04B 2237/60 (2013.01); C04B 2237/704 (2013.01); C04B 2237/706 (2013.01); C04B 2237/708 (2013.01); C04B 2237/86 (2013.01); H01L 23/3736 (2013.01); H01L 23/473 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/73265 (2013.01); H05K 1/0306 (2013.01); H05K 3/382 (2013.01);
Abstract

To provide a power-module substrate and a manufacturing method thereof in which small voids are reduced at a bonded part and separation can be prevented. Bonding a metal plate of aluminum or aluminum alloy to at least one surface of a ceramic substrate by brazing, when a cross section of the metal plate is observed by a scanning electron microscope in a field of 3000 magnifications in a depth extent of 5 μm from a bonded interface between the metal plate and the ceramic substrate in a width area of 200 μm from a side edge of the metal plate, residual-continuous oxide existing continuously by 2 μm or more along the bonded interface has total length of 70% or less with respect to a length of the field.


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