The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Dec. 13, 2012
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Ian S. Dees, Aloha, OR (US);

Thomas L. Kuntz, Portland, OR (US);

David L. Suryan, Hillsboro, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G01R 13/02 (2006.01); G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G06F 15/00 (2013.01); G01R 13/029 (2013.01); G01R 23/16 (2013.01);
Abstract

A test and measurement instrument having initial display center frequency and span settings and configured to process an input signal is disclosed. The test and measurement instrument includes a processor configured to digitize the input signal and locate a primary peak and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting based on the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured adjust the initial span setting based on the bandwidth comparison and generate a processed waveform signal using the adjusted display center frequency and span settings.


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