The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Apr. 09, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Matthias Wald, Jena, DE;
Renhu Shi, Göttingen, DE;
Alexander Scheps, Adelebsen, DE;
Harald Schadwinkel, Hanover, DE;
Jörg Schaffer, Göttingen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A system for microscopic applications, including a rotating structural element that acts as a beam splitter and has reflecting and transmitting structures, and which is disposed in an intermediate image plane of the beam path conjugated with the object field, and by which the structure is imaged onto an object in the object plane. The fluorescent light reflected by the object, or caused by the illumination, strikes the structural element as well as an image processing module. The beam reflected and transmitted by the structural element is guided through the image processing module. The structural element is set at an angle to the vertical of the beam path. An optical adapter, which tilts the microscopic intermediate image onto the plane of the structural element acting as beam splitter, is disposed at the interface between the microscope and the image processing module.