The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Nov. 05, 2015
Carl Zeiss Microscopy Gmbh, Jena, DE;
Beate Boehme, Grosspuerschuetz, DE;
Matthias Wald, Jena, DE;
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Weimar, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Carl Zeiss AG, Oberkochen, DE;
Abstract
A laser scanning microscope for the acquisition of object images according to varied observation criteria. The microscope includes an illumination and detection unit, an illumination and a detection beam, a microscope objective, a scanning device with a scanning optical component and several scanners, with switching mirrors, each mirror with two switching positions, provided in the illumination and detection beams. Each switching position is assigned to one of several different, optically separate beam paths and each beam path defines a separate operating mode. A concave mirror for imaging a first scanner into at least one more scanner and vice versa is arranged in at least one of the beam paths.