The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
May. 04, 2016
Mentor Graphics Corporation, Wilsonville, OR (US);
Huaxing Tang, Wilsonville, OR (US);
Yu Huang, Sudbury, MA (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Robert B. Benware, Clackamas, OR (US);
Xiaoxin Fan, Tualatin, OR (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices.