The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2018

Filed:

Jul. 03, 2014
Applicant:

Hitachi High-technologies Corporation, Minato-ku, Tokyo, JP;

Inventors:

Manami Nammoku, Tokyo, JP;

Kohshi Maeda, Tokyo, JP;

Takehiko Hosoiri, Tokyo, JP;

Yasunori Shoji, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01N 21/51 (2006.01); G01N 21/64 (2006.01); G01N 1/30 (2006.01); G01N 1/38 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01N 1/30 (2013.01); G01N 1/38 (2013.01); G01N 21/51 (2013.01); G01N 21/645 (2013.01); G01J 2001/444 (2013.01);
Abstract

A nucleic acid analysis device is provided that is capable of quickly detecting device abnormalities, and the like. This device is provided with a temperature control block () for holding a tube () that includes a sample, a photometer (), and a device diagnosis unit. The photometer () is provided with an LED () for irradiating light toward the temperature control block () in a state in which the tube () is held and a fluorescence detector () for receiving light emitted by the sample in response to the irradiation of light from the LED (). The device diagnosis unit causes the LED () to irradiate light toward the temperature control block () in a state in which the tube () is not held, causes the fluorescence detector () to detect the resulting scattered light, and diagnoses the photometer () on the basis of the intensity of the scattered light.


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