The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2018
Filed:
Mar. 04, 2015
Apple Inc., Cupertino, CA (US);
Lucas Allen Whipple, Belmont, CA (US);
Simon Regis Louis Lancaster-Larocque, Gloucester, CA;
Collin D. Chan, Dublin, CA (US);
Christopher R. Fagan, Pacifica, CA (US);
Vincent Yan, San Francisco, CA (US);
Ian S. Theilacker, West Chester, PA (US);
Brian K. Miehm, Los Altos, CA (US);
Shravan Bharadwaj, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
A method and system for observing and monitoring thermal characteristics of a machining operation, such as a surface finishing operation, performed on a workpiece is disclosed. The surface finishing operation can be performed on the workpiece in order to remove a surface defect, e.g. a parting line, on a surface of the workpiece and/or to provide a mirror-like finish to the workpiece. In one embodiment, an emissive layer is applied to the workpiece to increase a thermal emissivity of the workpiece. In some embodiments, a finishing surface, such as a polishing or buffing wheel, and/or a lubricant used in a finishing operation is monitored. A thermal profile of the surface of the workpiece, finishing surface and/or lubricant can be obtained. The finishing operation can be modified in response to the monitored thermal characteristics to prevent the occurrence of defects and improve the efficacy of the finishing operation.