The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2017
Filed:
Dec. 22, 2015
Shanghai Huahong Grace Semiconductor Manufacturing Corporation, Shanghai, CN;
Liang Qian, Shanghai, TW;
Abstract
A memory testing circuit and method are disclosed, the redesigning of a memory to be tested through incorporation therein a testing circuit includes a self-test circuit incorporating a decoder circuit, and a VPPIO I/O module incorporating an encoder circuit and having multiple functions including digital I/O, high analog voltage I/O and current I/O. An oscillator module embedded in the multiplexer circuit provides a clock signal for the testing. The VPPIO I/O module is configured to convert, by the self-test circuit, a stimulating input from a single signal pin to a parallel signal recognizable by the memory and an analog voltage/current signal, thereby accomplishing proper testing of the memory. This enables a single signal pin to test all functions of one memory, thereby increasing the number of memory dies on a wafer tested in parallel by a test instrument and reducing the testing time per wafer as well as testing cost.