The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 19, 2017

Filed:

Jan. 22, 2014
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventor:

Richard I. Mellitz, Prosperity, SC (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 15/00 (2006.01); G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
G01R 27/32 (2013.01);
Abstract

Examples are disclosed for characterizing a transmission line. Sets of scatter parameters (s-parameters) associated with measured or modeled insertion loss (IL) or return loss (RL) values over a range of frequencies may be acquired for a transmission line. One or more parameter values for use in IL or RL fit functions may be adjusted to reach a threshold for a coefficient of determination (R) value of a curve generated using the IL or RL fit functions to approximate the set of s-parameters over the range of frequencies. The IL or RL fit functions may then be used to generate other sets of s-parameters associated with IL or RL values for a recreated model of the transmission line. The other sets of s-parameters may be scaled to characterize transmission lines of various lengths. Other examples are described and claimed.


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