The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Mar. 11, 2015
Applicant:

Toshiba Memory Corporation, Minato-ku, Tokyo, JP;

Inventors:

Hideaki Sakurai, Kanagawa, JP;

Machiko Suenaga, Kanagawa, JP;

Takeharu Motokawa, Kanagawa, JP;

Masatoshi Terayama, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 7/00 (2006.01); C03C 17/36 (2006.01); C03C 17/38 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0002 (2013.01); C03C 17/36 (2013.01); C03C 17/3649 (2013.01); C03C 17/38 (2013.01); C03C 2218/34 (2013.01);
Abstract

A patterning method according to one embodiment includes forming a ground layer on a processing target layer. The ground layer has higher affinity for one of a first segment and a second segment contained in a self-assembly material than for the other segment. The neutral layer is patterned on the ground layer. The neutral layer is neutral to the first segment and the second segment. Exposing surfaces of the ground layer and the neutral layer is irradiated with an energy ray. The self-assembly material is applied onto the ground layer and the neutral layer. The self-assembly material is phase-separated into a first domain including the first segment and a second domain including the second segment. One of the first domain and the second domain is selectively removed.


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