The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Jul. 03, 2013
Hitachi High-technologies Corporation, Tokyo, JP;
Naomi Ishii, Tokyo, JP;
Kumiko Kamihara, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analysis device includes: a factor storage unitwhich stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unitwhich judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit; and a factor judgment unitwhich refers to the results of the judgment by the abnormality judgment unitin a preset order, and would judge as an abnormality factor a factor stored in the factor storage unitin association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal. The operator is informed of the abnormality factor on the basis of the result of the judgment by the factor judgment unit. With this configuration, deterioration in the measurement accuracy can be reduced through the detection of an abnormality in the measurement result and the determination of the causative factor.