The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2017

Filed:

Jun. 10, 2016
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kippei Sugita, Miyagi, JP;

Tomohide Minami, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/24 (2006.01); G01R 27/26 (2006.01); G01R 31/28 (2006.01); H01J 37/32 (2006.01); G01R 31/3185 (2006.01); G01R 31/265 (2006.01);
U.S. Cl.
CPC ...
G01N 27/24 (2013.01); G01R 27/2605 (2013.01); G01R 31/2831 (2013.01); H01J 37/32009 (2013.01); G01R 31/265 (2013.01); G01R 31/318511 (2013.01); H01J 37/321 (2013.01); H01J 37/32211 (2013.01);
Abstract

A system of inspecting a focus ring is provided. The system includes a measuring device, a transfer device and an operation unit. The measuring device includes a base substrate, a sensor chip and a circuit board. The sensor chip has a sensor electrode and is provided along an edge of the base substrate. The circuit board is configured to output a high frequency signal to the sensor electrode and acquire a digital value indicating electrostatic capacitance based on a voltage amplitude in the sensor electrode. The transfer device is configured to scan the measuring device. The operation unit is configured to obtain difference values by performing a difference operation with respect to the digital values acquired by the measuring device at multiple positions along a direction which intersects with an inner periphery of the focus ring.


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