The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
May. 21, 2013
Fluidigm Corporation, South San Francisco, CA (US);
Megan Anderson, Washington, DC (US);
Peilin Chen, Richmond, CA (US);
Brian Fowler, San Mateo, CA (US);
Fiona Kaper, Solano Beach, CA (US);
Ronald Lebofsky, Etobicoke, CA;
Andrew May, San Francisco, CA (US);
FLUIDIGM CORPORATION, South San Francisco, CA (US);
Abstract
In certain embodiments, the invention provides methods and devices for assaying single particles in a population of particles, wherein at least two parameters are measured for each particle. One or more parameters can be measured while the particles are in the separate reaction volumes. Alternatively or in addition, one or more parameters can be measured in a later analytic step, e.g., where reactions are carried out in the separate reaction volumes and the reaction products are recovered and analyzed. In particular embodiments, one or more parameter measurements are carried out 'in parallel,' i.e., essentially simultaneously in the separate reaction volumes.