The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Nov. 08, 2016
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Tatsuo Nakayama, Tokyo, JP;

Hironobu Miyamoto, Tokyo, JP;

Yasuhiro Okamoto, Tokyo, JP;

Yoshinao Miura, Tokyo, JP;

Takashi Inoue, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/778 (2006.01); H01L 23/522 (2006.01); H01L 29/15 (2006.01); H01L 29/417 (2006.01); H01L 29/861 (2006.01); H01L 29/20 (2006.01); H01L 27/06 (2006.01); H01L 29/06 (2006.01); H01L 29/423 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7783 (2013.01); H01L 23/5226 (2013.01); H01L 27/0605 (2013.01); H01L 29/0649 (2013.01); H01L 29/155 (2013.01); H01L 29/2003 (2013.01); H01L 29/41758 (2013.01); H01L 29/861 (2013.01); H01L 29/1066 (2013.01); H01L 29/1075 (2013.01); H01L 29/1087 (2013.01); H01L 29/41766 (2013.01); H01L 29/4236 (2013.01); H01L 2924/0002 (2013.01);
Abstract

The semiconductor device includes a trench that penetrates a barrier layer, and reaches a middle portion of a channel layer among an n+ layer, an n-type layer, a p-type layer, the channel layer, and the barrier layer which are formed above a substrate, a gate electrode arranged within the groove through a gate insulating film, and a source electrode and a drain electrode which are formed above the barrier layer on both sides of the gate electrode. The n-type layer and the drain electrode are electrically coupled by a connection portion that reaches the n+ layer. The p-type layer and the source electrode are electrically coupled by a connection portion that reaches the p-type layer. A diode including a p-type layer and an n-type layer is provided between the source electrode and the drain electrode, to thereby prevent the breaking of an element caused by an avalanche breakdown.


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