The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Jun. 24, 2014
Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Bai Yen Nguyen, Singapore, SG;

Benjamin Lau, Singapore, SG;

Chou-Te Kang, Singapore, SG;

Yao Hsien Huang, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/38 (2006.01); G11C 29/36 (2006.01); G11C 29/44 (2006.01); G11C 29/54 (2006.01);
U.S. Cl.
CPC ...
G11C 29/38 (2013.01); G11C 29/36 (2013.01); G11C 29/44 (2013.01); G11C 2029/3602 (2013.01);
Abstract

A system and method for testing performance of a plurality of memory modules includes generating a clock signal at a set frequency and sending the clock signal to the memory modules. An initial data pattern is sent to an input of a first memory module. A subsequent data pattern received from the first memory module is delayed by a predetermined delay time and sent to an input of a last memory module. The initial data pattern and the subsequent data pattern received from the output of the last memory module are compared and a performance of the memory modules is also calculated.


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