The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2017

Filed:

Jun. 28, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Nian Niles Yang, Mountain View, CA (US);

Chris Nga Yee Yip, Saratoga, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G11C 11/5628 (2013.01);
Abstract

Systems, methods and/or devices are used to adjust a read property for a memory portion of non-volatile memory. In one aspect, in response to receiving a program request, the device: detects a first temperature of the memory portion; and stores first temperature data corresponding to the detected first temperature. In response to receiving a read request, the device performs an adjustment determination, including: detecting a second temperature of the memory portion of the non-volatile memory, retrieving the stored first temperature data, and determining, in accordance with the detected second temperature and the retrieved first temperature data, whether to perform the read using an adjusted read property. In accordance with a determination to perform the read using the adjusted read property, the device performs a read on the memory portion using the adjusted read property.


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