The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Sep. 21, 2015
Applicant:

Intel Ip Corporation, Santa Clara, CA (US);

Inventors:

Dae Jung Yoon, Santa Clara, CA (US);

Bertram Gunzelmann, Koenigsbrunn, DE;

Ansgar Scherb, Nuremberg, DE;

Assignee:

INTEL IP CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04W 56/00 (2009.01); H04W 4/02 (2009.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04W 56/001 (2013.01); H04L 5/0007 (2013.01); H04W 4/02 (2013.01);
Abstract

A mobile terminal device includes a receiver circuit and a processing circuit. The receiver circuit is configured to receive a plurality of reference signal patterns from a plurality of transmission locations, wherein each of the plurality of reference signal patterns corresponds to a respective transmission location of the plurality of transmission locations. The processing circuit is configured to determine a synchronization offset estimate for each of the plurality of transmission locations based on the plurality of reference signal patterns to generate a plurality of synchronization offset estimates; determine if a minimum-valued synchronization offset estimate of the plurality of synchronization offset estimates satisfies predefined criteria; and determine a reception time window for processing data based on the minimum-valued synchronization offset estimate if the minimum-valued synchronization offset estimate satisfies the predefined criteria.


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