The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2017
Filed:
Mar. 17, 2015
Applicant:
Intel Ip Corporation, Santa Clara, CA (US);
Inventor:
Stefan Fechtel, Zorneding, DE;
Assignee:
Intel IP Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04L 5/00 (2006.01); H04W 72/12 (2009.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04L 5/00 (2013.01); H04W 72/1231 (2013.01);
Abstract
A method for estimating noise and interferer parameters includes receiving a signal comprising a noise and interference signal contribution. Noise and interference power samples are generated based on the signal. The noise and interference power samples are quantized into quantization levels. The occurrences of noise and interference power samples are accumulated for each quantization level during an observation period. Noise and interferer parameters are estimated based on the number of occurrences of noise and interference power samples per quantization level during the observation period.