The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Nov. 17, 2015
Applicant:

Nvidia Corporation, Santa Clara, CA (US);

Inventors:

Gurpreet Shinh, Cupertino, CA (US);

Donald E. Templeton, San Jose, CA (US);

Brian S. Schieck, Hayward, CA (US);

Alex Waizman, Sunnyvale, CA (US);

Assignee:

NVIDIA Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/16 (2006.01); H01L 23/498 (2006.01); H01L 23/50 (2006.01); H01L 23/64 (2006.01); H01L 25/18 (2006.01);
U.S. Cl.
CPC ...
H01L 25/16 (2013.01); H01L 23/49816 (2013.01); H01L 23/49822 (2013.01); H01L 23/49827 (2013.01); H01L 23/49838 (2013.01); H01L 23/50 (2013.01); H01L 23/645 (2013.01); H01L 25/18 (2013.01); H01L 2224/16225 (2013.01); H01L 2924/15192 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/19041 (2013.01); H01L 2924/19105 (2013.01);
Abstract

A system includes a semiconductor die mounted on a packaging substrate, a signal redistribution layer that is formed within the packaging substrate, a power plane that is formed on a surface of the packaging substrate, and a ground plane that is formed within the packaging substrate. The power plane couples the semiconductor die to a capacitor disposed on the packaging substrate and the ground plane is disposed between the power plane and the signal redistribution layer. An advantage of the disclosed system is that loop inductance between power and ground paths to a packaged semiconductor die is reduced, thereby lowering the impedance of the packaged semiconductor die system and signal noise associated with the packaged semiconductor system.


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