The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2017

Filed:

Nov. 21, 2016
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Timothy Michaelson, Milpitas, CA (US);

Timothy W. Weidman, Sunnyvale, CA (US);

Barry Lee Chin, Saratoga, CA (US);

Majeed Foad, Sunnyvale, CA (US);

Paul Deaton, San Jose, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03C 5/00 (2006.01); G03F 7/00 (2006.01); G03F 7/20 (2006.01); G03F 7/16 (2006.01); G03F 7/09 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70716 (2013.01); G03F 7/09 (2013.01); G03F 7/167 (2013.01); G03F 7/2037 (2013.01);
Abstract

A photoresist vapor deposition system includes: a vacuum chamber having a heating element and cooled chuck for holding a substrate, the vacuum chamber having a heated inlet; and a vapor deposition system connected to the heated inlet for volatilizing a precursor into the vacuum chamber for condensing a photoresist over the substrate cooled by the cooled chuck. The deposition system creates a semiconductor wafer system that includes: a semiconductor wafer; and a vapor deposited photoresist over the semiconductor wafer. An extreme ultraviolet lithography system requiring the semiconductor wafer system includes: an extreme ultraviolet light source; a mirror for directing light from the extreme ultraviolet light source; a reticle stage for imaging the light from the extreme ultraviolet light source; and a wafer stage for placing a semiconductor wafer with a vapor deposited photoresist.


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