The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Mar. 27, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Edmond Chalom, Petach Tikvah, IL;

Dmitry Rudoy, Haifa, IL;

Noam Levy, Karmiel, IL;

Harish Essaky Sankaran, Tampere, FI;

Jarno Nikkanen, Kangasala, FI;

Joni-Matti Maatta, Tampere, FI;

German Voronov, Holon, IL;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/20 (2006.01); G06K 9/36 (2006.01); H04N 5/232 (2006.01); G06T 7/11 (2017.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); G06K 9/00684 (2013.01); G06T 7/11 (2017.01); H04N 5/23222 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Methods, apparatuses and systems may provide for operating a machine learning device by obtaining training image data, conducting an offline prediction analysis of the training image data with respect to one or more real-time parameters of an image capture device, and generating one or more parameter detection models based on the offline prediction analysis. Additionally, methods, apparatuses and systems may provide for operating the image capture device by obtaining a candidate image associated with the image capture device, determining that the candidate image corresponds to a particular type of scene represented in a parameter prediction model, and adjusting one or more real-time parameters of the image capture device based at least in part on one or more parameter values associated with the particular type of scene.


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