The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Mar. 03, 2016
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Hiroki Shinkawata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 22/34 (2013.01);
Abstract

A semiconductor device reduces measurement time. The semiconductor device according to an embodiment of the invention includes: plural series-coupled resistance elements for testing; plural switches coupled to a coupling path coupling the resistance elements; and plural selection circuits to select, by turning on or off the switches, a number of the series-coupled resistance elements to be measured as a group. In the semiconductor device: the switches include plural first switches coupled to plural groups of the resistance elements, each of the groups including N (N=2 or a larger integer) of the resistance elements; and the selection circuits turn the first switches on or off and thereby select a number of the series-coupled resistance elements to be measured as a group, the number equaling the N.


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