The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2017

Filed:

Sep. 11, 2015
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Wen Chen, Austin, TX (US);

Jayanta Bhadra, Austin, TX (US);

Lawrence L. Case, Austin, TX (US);

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/85 (2013.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06F 21/85 (2013.01); G06N 99/005 (2013.01);
Abstract

A runtime classifier hardware circuit is incorporated into an electronic device for implementing hardware security by storing a support vector model in memory which is derived from pre-silicon verification data to define secure behavior for a first circuit on the electronic device; monitoring input and/or output signals associated with the first circuit using the runtime classifier hardware circuit which compares the input and/or output signals to the support vector model to detect an outlier input signal and/or outlier output signal for the first circuit; and blocking the outlier input and/or output signal from being input to or output from the first circuit.


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