The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jun. 21, 2013
Applicant:
Hitachi High-technologies Corporation, Tokyo, JP;
Inventors:
Assignee:
Hitachi High-Technologies Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/75 (2006.01); G01N 33/543 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54386 (2013.01); G01N 21/6428 (2013.01); G01N 21/6452 (2013.01); G01N 33/54326 (2013.01); G01N 33/54366 (2013.01);
Abstract
An object of the present invention is to provide a highly sensitive immunoanalysis method and analysis apparatus. The invention relates to an analysis method and an analysis apparatus which are constituted in such a way that a component to be measured is reacted with capture component specifically reacting thereto and the reactant is labeled when the component to be measured is present and which are characterized by analyzing the component to be measured with single-molecule sensitivity and resolution by arranging the labeled reactant in a spatially separated certain position and detecting the label of the labeled reactant.