The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2017
Filed:
Jul. 29, 2015
Hitachi High-technologies Corporation, Tokyo, JP;
HITACHI HIGH-TECHNOLOGIES CORPORATION, Tokyo, JP;
Abstract
A technician is forced to determine the measurement time to be used in a selected ion monitoring (SIM) measurement while observing mass spectral data. Thus, mass spectral data and one or a plurality of mass chromatogram data items is generated on the basis of the detection results of an ion detection unit, and, for each corresponding ion component, the measurement time to be used in SIM is determined on the basis of the elution time range represented by each peak waveform of the one or plurality of mass chromatogram data items that have been generated.
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