The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Apr. 13, 2017
Applicant:
Globalfoundries Inc., Grand Cayman, KY;
Inventors:
Min Gyu Sung, Latham, NY (US);
Ruilong Xie, Schenectady, NY (US);
Chanro Park, Clifton Park, NY (US);
Dong-Ick Lee, Loudonville, NY (US);
Assignee:
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/51 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 29/513 (2013.01); H01L 29/66545 (2013.01);
Abstract
A method of manufacturing a FinFET structure involves forming a gate cut within a sacrificial gate layer and backfilling the gate cut opening with etch selective dielectric materials. Partial etching of one of the dielectric materials can be used to increase the distance between the gate cut (isolation) structure and an adjacent fin relative to methods that do not perform a backfilling step using etch selective materials.