The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2017
Filed:
Feb. 19, 2015
Applicant:
Protochips, Inc., Raleigh, NC (US);
Inventors:
Daniel Stephen Gardiner, Wake Forest, NC (US);
William Bradford Carpenter, Asheville, NC (US);
John Damiano, Jr., Apex, NC (US);
Franklin Stampley Walden, II, Raleigh, NC (US);
David P. Nackashi, Raleigh, NC (US);
Assignee:
Protochips, Inc., Morrisville, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 7/00 (2006.01); G01N 21/03 (2006.01); G01K 11/32 (2006.01); H01J 37/26 (2006.01); H01J 37/16 (2006.01); G01L 11/02 (2006.01); H01J 37/20 (2006.01); G01L 19/04 (2006.01);
U.S. Cl.
CPC ...
H01J 37/261 (2013.01); G01K 11/32 (2013.01); G01L 11/025 (2013.01); G01L 19/04 (2013.01); H01J 37/16 (2013.01); H01J 37/20 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/2801 (2013.01);
Abstract
An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.