The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Oct. 28, 2014
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventor:

Detlef Hein, Göttingen, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/24 (2006.01); G02B 21/26 (2006.01); F16M 11/04 (2006.01); F16M 11/18 (2006.01); F16M 11/20 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); F16M 11/046 (2013.01); F16M 11/18 (2013.01); F16M 11/2021 (2013.01); G02B 21/0012 (2013.01); G02B 21/241 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); F16M 2200/021 (2013.01);
Abstract

A digital microscope having a pivoting stand, a method for calibrating said stand and a method for automatic focus tracking and image center tracking upon actuation of the pivoting stand. The pivoting stand includes an angle sensor for determining a current pivot angle of the pivot arm (). The current pivot angle is processed in the control unit to execute automatic focus tracking and/or center tracking upon actuation of the pivot arm (). Calibration is performed using two pivot angles, wherein deviating focus and image center positions are ascertained, and a pivot-angle-dependent function for focus and the image center position is ascertained therefrom.


Find Patent Forward Citations

Loading…