The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Dec. 14, 2015
Applicant:

Via Alliance Semiconductor Co., Ltd., Shanghai, CN;

Inventors:

Peng Li, Shanghai, CN;

Zhongding Liu, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/30 (2006.01); G01R 15/04 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 15/04 (2013.01); G01R 19/0092 (2013.01);
Abstract

A measurement device measuring a current passing through a detection resistor coupled between a first node and a second node is provided. An interference elimination unit is coupled to the first and second nodes and selectively outputs the voltage of at least one of the first and second nodes according to a control signal. A first voltage-dividing unit is coupled to the interference elimination unit and processes the voltage of the first or second node to generate a first processed signal. A second voltage-dividing unit is coupled to the interference elimination unit and processes the voltage of the first or second node to generate a second processed signal. A processing unit is coupled to the first and second voltage-dividing units to receive the first and second processed signals and calculates the first and second processed signals to obtain the current passing through the detection resistor.


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Li, Peng. (2017). Measuring device (U.S. Patent No. 9817034). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9817034

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