The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2017

Filed:

Aug. 10, 2016
Applicant:

Toshiba Memory Corporation, Tokyo, JP;

Inventors:

Ayako Kawanishi, Yokohama Kanagawa, JP;

Yusuke Kasahara, Yokohama Kanagawa, JP;

Hiroki Yonemitsu, Chigasaki Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/308 (2006.01); H01L 21/311 (2006.01); C09D 153/00 (2006.01); G03F 7/16 (2006.01); G03F 7/26 (2006.01); G03F 7/00 (2006.01); H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
C09D 153/00 (2013.01); G03F 7/0002 (2013.01); H01L 21/0337 (2013.01); H01L 21/31144 (2013.01);
Abstract

A pattern forming method includes forming a guide mask layer including a first feature having a first opening width, a second feature having a second opening width, a third feature having a third opening width. The first width being less than the second width and greater than the third width. A self-organizing material having a phase-separation period is disposed on the guide mask layer to at least partially fill the first, second, and third features. The self-organizing material is process to the cause phase-separation into first and second polymer portions. The first width is greater than the phase-separation period and the third width is less. A masking pattern is formed on the first layer by removing the second polymer portions and leaving the first polymer portions. The masking pattern is then transferred to the first layer.


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