The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 07, 2017

Filed:

Nov. 01, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dongkyo Shim, Seoul, KR;

Sang-Soo Park, Hwaseong-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/16 (2006.01); G11C 11/56 (2006.01); G11C 16/14 (2006.01); G11C 16/04 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3445 (2013.01); G11C 11/5635 (2013.01); G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/14 (2013.01); G11C 16/16 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01);
Abstract

A nonvolatile memory device may include a memory cell array, an address decoder circuit, a page buffer circuit, and a control logic circuit. An erase operation includes iteratively performing an erase loop which includes an erase section where an erase voltage is applied to the memory cells of the selected memory block and an erase verification section where the memory cells of the selected memory block are verified using an erase verification voltage. If the memory cells of the selected memory block are determined as an erase pass in the erase verification section, the control logic circuit monitors the memory cells of the selected memory block. If the monitored result indicates that the memory cells of the selected memory block are at an abnormal state, the control logic circuit applies an extra erase voltage to the memory cells of the selected memory block.


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