The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Jan. 07, 2014
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Xin Ping Zeng, San Jose, CA (US);
Hui Yu, San Jose, CA (US);
Keith Schaub, Austin, TX (US);
Liang Ge, San Jose, CA (US);
Heng Huat Goh, San Jose, CA (US);
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H03K 19/0005 (2013.01); G01R 31/2822 (2013.01); G01R 31/2834 (2013.01);
Abstract
In a testing device, a method for implementing automatic RF port testing. The method includes attaching a device under test having a plurality of RF pins to a load board, dynamically tuning a plurality of RF ports of the load board to the plurality of RF pins, and automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance. The method further includes implementing an RF port testing process on the device under test.