The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
Nov. 13, 2014
Carl Zeiss Microscopy Gmbh, Jena, DE;
Wolfgang Singer, Aalen, DE;
David Shafer, Fairfield, CT (US);
Artur Degen, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An arrangement for light sheet microscopy including illumination optics with an illumination objective for illuminating a sample, located in a medium on a sample carrier aligned with respect to a plane reference surface, with a light sheet. The arrangement also includes detection optics with a detection objective. The arrangement further includes a separating layer system with at least one layer separating the medium from the illumination and detection objectives. The separating layer system contacts the medium by a base surface aligned parallel to the reference surface. A correction lens system, with at least one correction lens serving to reduce those aberrations which occur as a result of the oblique passage of illumination light and/or of light to be detected through interfaces of the separating layer system, is arranged between illumination objective and separating layer system and/or between detection objective and separating layer system.