The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Sep. 22, 2014
Applicants:

Eyal Melamed-kohen, Modiin, IL;

Ilan Cohen, Elad, IL;

Shlomi Sde-paz, Kadima, IL;

Inventors:

Eyal Melamed-Kohen, Modiin, IL;

Ilan Cohen, Elad, IL;

Shlomi Sde-Paz, Kadima, IL;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3181 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31716 (2013.01); G01R 31/3181 (2013.01);
Abstract

An integrated circuit comprises a first functional unit and one or more other functional units. The first functional unit has an input for receiving data and an output for providing data. The integrated circuit tests and operates the first functional unit. Testing comprises: connecting the input of the first functional unit to the output of the first functional unit, thereby generating a loopback path from the output of the first functional unit to the input of the first functional unit; loading a test pattern onto the first functional unit; feeding a test clock signal comprising one or more clock edges, thereby prompting the first functional unit to transform the test pattern; and reading the transformed test pattern. Operating the first functional unit comprises: connecting the input of the first functional unit to an output of the other functional units; and feeding a normal clock signal to the first functional unit.


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