The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 31, 2017
Filed:
May. 18, 2015
Applicant:
Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;
Inventors:
Assignee:
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu, TW;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 31/2646 (2013.01);
Abstract
Some embodiments of the present disclosure provide a method including turning on a noise-measuring system for a device under test (DUT) with the DUT turned off; measuring a first phase noise caused by the noise-measuring system; turning on the DUT; measuring a second phase noise caused by the noise-measuring system and the DUT; and subtracting the first phase noise from the second phase noise to obtain a third phase noise caused by the DUT.
Horng, Jaw-Juinn. (2017). Device testing and monitoring method thereof (U.S. Patent No. 9804220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9804220
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile