The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 2017

Filed:

Jan. 14, 2014
Applicant:

Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);

Inventors:

Ryan German, Riverdale, NJ (US);

Benjamin S. Pollack, Budd Lake, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 35/10 (2006.01); B65G 43/08 (2006.01);
U.S. Cl.
CPC ...
G01N 35/021 (2013.01); B65G 43/08 (2013.01); G01N 35/0095 (2013.01); G01N 35/0099 (2013.01); G01N 35/00871 (2013.01); G01N 35/04 (2013.01); G01N 35/1011 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/00881 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0462 (2013.01); G01N 2035/0494 (2013.01); Y10T 436/113332 (2015.01);
Abstract

Methods and systems allow characterization of sample vessels and carriers in an automation system to determine any physical deviation from nominal positions. In response, an offset can be calculated and applied when positioning a carrier relative to a station, such as a testing or processing stations (or vice-versa). This may allow for precise operation of an instrument with a sample vessel on an automation track, while compensating for deviation in manufacturing and other tolerances.


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