The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Apr. 01, 2014
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Sho Tatsuoka, Naka, JP;

Kenji Yamaguchi, Naka, JP;

Akira Osada, Naka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); C23C 16/34 (2006.01); C23C 16/36 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
C23C 16/34 (2013.01); B23B 27/148 (2013.01); C23C 16/36 (2013.01); C23C 16/45523 (2013.01); B23B 2228/04 (2013.01); B23B 2228/105 (2013.01);
Abstract

A hard coating layer on a cutting tool includes at least a Ti and Al complex nitride or carbonitride layer and has an average layer thickness of 1 to 20 μm. In a case where a composition of the complex nitride or carbonitride layer is expressed by: (TiAl)(CN), a content ratio x and a content ratio y satisfy 0.60≦x≦0.95 and 0≦y≦0.005, where x and y are in atomic ratio. Crystal grains constituting the complex nitride or carbonitride layer include cubic phase crystal grains and hexagonal phase crystal grains. An area ratio occupied by the cubic phase crystal grains is 30-80%. An average grain width W is 0.05-1.0 μm. An average aspect ratio A of the crystal grains with the cubic grain structure is 5 or less. A periodic content ratio change of Ti and Al in (TiAl)(CN) exists in each of the cubic phase crystal grains.


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