The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Feb. 09, 2015
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Hiroji Aga, Takasaki, JP;

Norihiro Kobayashi, Takasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/762 (2006.01); H01L 21/02 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76254 (2013.01); H01L 21/022 (2013.01); H01L 21/02164 (2013.01); H01L 21/324 (2013.01);
Abstract

The present invention is a method for manufacturing a bonded SOI wafer including: performing a thermal oxidation treatment including at least one of a thermal oxidation during temperature-rising and a thermal oxidation during temperature-falling with the use of a batch type heat treatment furnace, thereby forming a silicon oxide film in such a way that the oxide film buried in the delaminated bonded SOI wafer has a concentric oxide film thickness distribution, and subjecting the bonded SOI wafer after delaminating a bond wafer to a reducing heat treatment to make a film thickness range of the buried oxide film being smaller than a film thickness range before the reducing heat treatment. This provides a method for manufacturing a bonded SOI wafer which can suppress a variation of a radial distribution of a buried oxide film thickness caused by a reducing heat treatment performed after delaminating the SOI layer.


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