The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Feb. 27, 2015
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Shin Masuda, Miyagi, JP;

Hideo Hara, Miyagi, JP;

Tsuyoshi Ataka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/319 (2006.01); G01R 31/3163 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31917 (2013.01); G01R 31/3163 (2013.01); G01R 31/3191 (2013.01); G01R 31/31713 (2013.01); G01R 31/31901 (2013.01);
Abstract

Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.


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