The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Oct. 04, 2016
Applicant:

Mie Fujitsu Semiconductor Limited, Kuwana, Mie, JP;

Inventors:

Teymur Bakhishev, San Jose, CA (US);

Lingquan Wang, Irvine, CA (US);

Dalong Zhao, San Jose, CA (US);

Pushkar Ranade, Los Gatos, CA (US);

Scott E. Thompson, Gainesville, FL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/76 (2006.01); H01L 29/94 (2006.01); H01L 31/062 (2012.01); H01L 31/113 (2006.01); H01L 31/119 (2006.01); H01L 27/146 (2006.01); H01L 29/78 (2006.01); H01L 29/10 (2006.01); H04N 5/3745 (2011.01);
U.S. Cl.
CPC ...
H01L 27/14616 (2013.01); H01L 27/14689 (2013.01); H01L 29/105 (2013.01); H01L 29/1083 (2013.01); H01L 29/7833 (2013.01); H01L 29/7838 (2013.01); H04N 5/3745 (2013.01); H01L 27/14643 (2013.01); H01L 29/1087 (2013.01);
Abstract

Semiconductor devices and methods of fabricating such devices are provided. The devices include source and drain regions on one conductivity type separated by a channel length and a gate structure. The devices also include a channel region of the one conductivity type formed in the device region between the source and drain regions and a screening region of another conductivity type formed below the channel region and between the source and drain regions. In operation, the channel region forms, in response to a bias voltage at the gate structure, a surface depletion region below the gate structure, a buried depletion region at an interface of the channel region and the screening region, and a buried channel region between the surface depletion region and the buried depletion region, where the buried depletion region is substantially located in channel region.


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