The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Aug. 01, 2011
Applicants:

Wai-yip Chan, Kingston, CA;

Tiago H Falk, St. Hubert, CA;

Qingfeng Xu, Waterloo, CA;

Inventors:

Wai-Yip Chan, Kingston, CA;

Tiago H Falk, St. Hubert, CA;

Qingfeng Xu, Waterloo, CA;

Assignee:

Avaya, Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10L 25/00 (2013.01); G10L 25/69 (2013.01); H04M 1/24 (2006.01); H04M 3/22 (2006.01);
U.S. Cl.
CPC ...
G10L 25/69 (2013.01);
Abstract

A non-intrusive speech quality estimation technique is based on statistical or probability models such as Gaussian Mixture Models ('GMMs'). Perceptual features are extracted from the received speech signal and assessed by an artificial reference model formed using statistical models. The models characterize the statistical behavior of speech features. Consistency measures between the input speech features and the models are calculated to form indicators of speech quality. The consistency values are mapped to a speech quality score using a mapping optimized using machine learning algorithms, such as Multivariate Adaptive Regression Splines ('MARS'). The technique provides competitive or better quality estimates relative to known techniques while having lower computational complexity.


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