The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Dec. 18, 2015
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventors:

Reenee Tayal, Delhi, IN;

Vishal Agarwal, Noida, IN;

Mayank Sharma, Noida, IN;

Farhat Alam Khan, Ghaziabad, IN;

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5068 (2013.01);
Abstract

The present disclosure relates to a system and method for fluid parameterized cell (Pcell) evaluation. Embodiments may include displaying a fluid Pcell in a first format. Embodiments may further include identifying a first state in a fluid Pcell evaluation code. In some embodiments, the first state may indicate that alterations are being made to the fluid Pcell. Embodiments may also include displaying instances of the fluid Pcell in a second format based upon, at least in part, identifying the first state in the fluid Pcell evaluation code. Embodiments may further include identifying a second state in the fluid Pcell evaluation code. In some embodiments, the second state may indicate the completion of the alterations to the fluid Pcell. Embodiments may also include displaying a final instance of the fluid Pcell in the first format based upon, at least in part, identifying the second state in the fluid Pcell evaluation code.


Find Patent Forward Citations

Tayal, Reenee. (2017). System and method for fluid parameterized cell evaluation (U.S. Patent No. 9785739). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9785739

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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