The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Sep. 10, 2014
Applicants:

Robert F. Moran, Largs, GB;

Alan Devine, Paisley, GB;

Alistair Paul Robertson, Glasgow, GB;

Inventors:

Robert F. Moran, Largs, GB;

Alan Devine, Paisley, GB;

Alistair Paul Robertson, Glasgow, GB;

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/14 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1415 (2013.01); G01R 31/3185 (2013.01); G01R 31/318544 (2013.01); G06F 2201/805 (2013.01);
Abstract

A peripheral integrated circuit (IC) device for providing support to a data processing IC device. The peripheral IC device comprises a fault detection component arranged to detect an occurrence of fault conditions within the data processing IC device. The peripheral IC device further comprises a safe state control component. Upon detection of a fault condition occurring within the data processing IC device by the fault detection component, the safe state control component is arranged to cause at least one I/O cell of the data processing IC device to be configured into at least one scan-chain, and cause at least one predefined control signal to be scanned into the at least one scan-chain to configure the at least one I/O cell into a state corresponding to the predefined control signal.


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