The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Aug. 29, 2014
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Aritomo Kikuchi, Saitama, JP;

Tsuyoshi Yamashita, Gunma, JP;

Mitsunori Aizawa, Saitama, JP;

Hiromitsu Horino, Saitama, JP;

Yuya Yamada, Gunma, JP;

Masataka Onozawa, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01C 11/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01C 11/00 (2013.01); G01R 1/0441 (2013.01); G01R 31/2893 (2013.01);
Abstract

Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.


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