The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Nov. 10, 2009
Applicants:

Juha Sunio, Hyvinkää, FI;

Jonna Nousiainen, Hyvinkää, FI;

Matti Pekkarinen, Helsinki, FI;

Inventors:

Juha Sunio, Hyvinkää, FI;

Jonna Nousiainen, Hyvinkää, FI;

Matti Pekkarinen, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01C 15/00 (2006.01); B61L 23/04 (2006.01);
U.S. Cl.
CPC ...
G01C 15/008 (2013.01); B61L 23/047 (2013.01);
Abstract

A measuring system comprising a fixed measurement unit (), a data processing unit () and a mobile unit (). The mobile unit comprises a planar base (), a reflector (), an elevation element () fixed to the base and the reflector, and attaching the reflector to a fixed position in respect of the base. The mobile unit comprises also mobility means () for moving the base along a surface () such that the spatial orientation of the base () substantially corresponds with the spatial orientation of the currently underlying part of the surface. In addition the mobile unit comprises tilt measuring means () for determining a deviation between the spatial orientation of the base and a plane perpendicular to the ambient gravitational force, and tilt elimination means for eliminating the effect of the determined deviation. Measurement results are thus more accurate.


Find Patent Forward Citations

Sunio, Juha. (2017). Runway measurement system and method (U.S. Patent No. 9784579). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9784579

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…