The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Sep. 15, 2016
Stmicroelectronics International N.v., Amsterdam, NL;
Ankur Bal, Greater Noida, IN;
Chandrajit Debnath, Greater Noida, IN;
Neha Bhargava, Greater Noida, IN;
STMicroelectronics International N.V., Schiphol, NL;
Abstract
A built-in self-test (BIST) circuit is provided for testing an analog-to-digital converter (ADC). A multi-order sigma-delta (ΣΔ) modulator has an input that receives an input signal, a first output generating analog test signal derived from the input signal and applied to an input of the ADC and a second output generating a binary data stream. A digital recombination and filtering circuit has a first input that receives the binary data stream and a second input that receives a digital test signal output from the ADC in response to the analog test signal. The digital recombination and filtering circuit combines and filters the binary data stream and digital test signal to generate a digital result signal including a signal component derived from an error introduced by operation of the ADC. A correlation circuit is used to isolate that error signal component.