The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2017

Filed:

Jun. 30, 2012
Applicants:

Yoshie Yamanaka, Tokyo, JP;

Ken Tachibana, Tokyo, JP;

Shunsaku Yoshikawa, Tokyo, JP;

Hikaru Nomura, Tokyo, JP;

Inventors:

Yoshie Yamanaka, Tokyo, JP;

Ken Tachibana, Tokyo, JP;

Shunsaku Yoshikawa, Tokyo, JP;

Hikaru Nomura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/00 (2006.01); B23K 35/26 (2006.01); C22C 13/00 (2006.01); C22C 13/02 (2006.01); H05K 3/34 (2006.01); B23K 35/02 (2006.01); B23K 1/00 (2006.01); H01B 1/02 (2006.01);
U.S. Cl.
CPC ...
H01L 24/13 (2013.01); B23K 1/0016 (2013.01); B23K 35/0222 (2013.01); B23K 35/0261 (2013.01); B23K 35/26 (2013.01); B23K 35/262 (2013.01); C22C 13/00 (2013.01); C22C 13/02 (2013.01); H01B 1/02 (2013.01); H01L 24/11 (2013.01); H05K 3/3457 (2013.01); H01L 2224/1301 (2013.01); H01L 2224/13147 (2013.01); H01L 2924/014 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01015 (2013.01); H01L 2924/01026 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01028 (2013.01); H01L 2924/01032 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/01049 (2013.01); H01L 2924/01051 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01083 (2013.01); H01L 2924/01322 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/15321 (2013.01); H01L 2924/15331 (2013.01); H01L 2924/181 (2013.01); H01L 2924/2076 (2013.01); H05K 2203/041 (2013.01);
Abstract

A lead-free solder ball is provided which suppresses interfacial peeling in a bonding interface of a solder ball, fusion defects which develop between the solder ball and solder paste, and which can be used both with Ni electrodes plated with Au or the like and Cu electrodes having a water-soluble preflux applied atop Cu. The lead-free solder ball for electrodes of BGAs or CSPs consists of 1.6-2.9 mass % of Ag, 0.7-0.8 mass % of Cu, 0.05-0.08 mass % of Ni, and a remainder of Sn. It has excellent resistance to thermal fatigue and to drop impacts regardless of the type of electrodes of a printed circuit board to which it is bonded, which are Cu electrodes or Ni electrodes having Au plating or Au/Pd plating as surface treatment. The composition may include at least one element selected from Fe, Co, and Pt in a total amount of 0.003-0.1 mass % or at least one element selected from Bi, In, Sb, P, and Ge in a total amount of 0.003-0.1 mass %.


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