The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Nov. 07, 2014
Applicant:
Freescale Semiconductor, Inc., Austin, TX (US);
Inventors:
William E. Edwards, Ann Arbor, MI (US);
Anthony F. Andresen, Chandler, AZ (US);
Randall C. Gray, Tempe, AZ (US);
Assignee:
NXP USA, INC., Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/327 (2006.01); G01R 19/00 (2006.01); H03K 17/18 (2006.01); H02B 1/24 (2006.01); G01R 19/165 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3274 (2013.01); G01R 19/16566 (2013.01); G01R 31/3275 (2013.01); G01R 31/3277 (2013.01);
Abstract
The embodiments described herein provide systems and methods for determining the health status of a sensed switch. In general, the embodiments described herein determine a measure of a health status of the sensed switch by comparing a voltage on the sensed switch, ascertaining a first comparator state under one test condition and ascertaining a second comparator state under a second test condition. The first comparator state and the second comparator state are and then compared to determine the measure of the health status of the sensed switch.